发明名称 Method and apparatus for programmable integrated circuit diagnostics.
摘要 <p>Apparatus and methods for programmably providing diagnostic information about a plurality of nodes inside of an integrated output pin by connecting said plurality of nodes and a programmable set of binary gate signals to a combinatorial logic circuit so that said combinatorial logic circuit provides a real time diagnostic signal to said dedicated output pin.</p>
申请公布号 EP0568330(A2) 申请公布日期 1993.11.03
申请号 EP19930303303 申请日期 1993.04.28
申请人 ADVANCED MICRO DEVICES, INC. 发明人 RUNALDUE, THOMAS J.;NGAI, PHILIP
分类号 G01R31/28;G01R31/3185;(IPC1-7):G06F11/22 主分类号 G01R31/28
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