发明名称 |
Method and apparatus for programmable integrated circuit diagnostics. |
摘要 |
<p>Apparatus and methods for programmably providing diagnostic information about a plurality of nodes inside of an integrated output pin by connecting said plurality of nodes and a programmable set of binary gate signals to a combinatorial logic circuit so that said combinatorial logic circuit provides a real time diagnostic signal to said dedicated output pin.</p> |
申请公布号 |
EP0568330(A2) |
申请公布日期 |
1993.11.03 |
申请号 |
EP19930303303 |
申请日期 |
1993.04.28 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
RUNALDUE, THOMAS J.;NGAI, PHILIP |
分类号 |
G01R31/28;G01R31/3185;(IPC1-7):G06F11/22 |
主分类号 |
G01R31/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|