发明名称 |
METHOD AND APPARATUS FOR AUTOMATED WAFER LEVEL TESTING AND RELIABILITY DATA ANALYSIS |
摘要 |
Methods and apparatus are disclosed for testing integrated circuits at the wafer level and for integrating test results, calculation of lifetimes and generation of trend charts in a common data base following testing. A wafer tester controller is supplemented with additional hardware and software to avoid data transfer errors and facilitate processing and storage of test results. The data base is available over a network to all areas of an organization. |
申请公布号 |
WO9705497(A1) |
申请公布日期 |
1997.02.13 |
申请号 |
WO1996US12533 |
申请日期 |
1996.07.31 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
TSIANG, JERRY;LANTZ, MIKKEL;PENG, YENG-KAUNG;SHIAU, YING |
分类号 |
G01R31/28;G01R31/319;H01L21/66;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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