发明名称 POWER SEMICONDUCTOR DEVICES HAVING IMPROVED HIGH FREQUENCY SWITCHING AND BREAKDOWN CHARACTERISTICS
摘要 <p>Integrated power semiconductor devices having improved high frequency switching performance, improved edge termination characteristics and reduced on-state resistance include GD-UMOSFET unit cells with upper trench-based gate electrodes and lower-trench based source electrodes. The use of the trench-based source electrode instead of a larger gate electrode reduces the gate-to-drain capacitance (CGD) of the UMOSFET and improves switching speed by reducing the amount of gate charging and discharging current that is needed during high frequency operation.</p>
申请公布号 WO2000025365(A2) 申请公布日期 2000.05.04
申请号 US1999024539 申请日期 1999.10.20
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