发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a semiconductor device is provided to reduce the loss of a plug of a charge storage electrode contact hole by performing an over etching process after preparing a conductive layer to compensate for the loss. CONSTITUTION: An interlayer dielectric(20) for partially exposing a semiconductor substrate(10) is formed by forming a contact hole. A conductive layer for burying the contact hole is formed on an upper portion of the interlayer dielectric(20). Then, the conductive layer is etched such that a protruded shape is formed only in the upper portion of the contact hole. A plug(30b) is formed in a conductive layer wiring and in the contact hole by performing an etching process with respect to the conductive layer using a bit line forming mask. The conductive layer includes a polycide layer.
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申请公布号 |
KR100257761(B1) |
申请公布日期 |
2000.06.01 |
申请号 |
KR19960071416 |
申请日期 |
1996.12.24 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD. |
发明人 |
CHOI, HONG KIL;KIM, JAE YUNG |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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