发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a semiconductor device is provided to reduce the loss of a plug of a charge storage electrode contact hole by performing an over etching process after preparing a conductive layer to compensate for the loss. CONSTITUTION: An interlayer dielectric(20) for partially exposing a semiconductor substrate(10) is formed by forming a contact hole. A conductive layer for burying the contact hole is formed on an upper portion of the interlayer dielectric(20). Then, the conductive layer is etched such that a protruded shape is formed only in the upper portion of the contact hole. A plug(30b) is formed in a conductive layer wiring and in the contact hole by performing an etching process with respect to the conductive layer using a bit line forming mask. The conductive layer includes a polycide layer.
申请公布号 KR100257761(B1) 申请公布日期 2000.06.01
申请号 KR19960071416 申请日期 1996.12.24
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD. 发明人 CHOI, HONG KIL;KIM, JAE YUNG
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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