发明名称 METHOD FOR PREVENTING AN OUT DIFFUSION OF DOPANT IN AN ULTRA SHALLOW JUNCTION
摘要 PURPOSE: An ultra shallow junction film preparing method is provided to obtain a high quality ultra shallow junction by preventing the increase of surface resistance of the junction. CONSTITUTION: Dopant is selectively implanted on a semiconductor plate(21). The dopant is activated with a thermal process having temperature-rising interval, temperature-maintaining interval and a temperature-declining interval. A nitride film(28) is formed on the surface of a region doped with the dopant during the temperature-declining interval in order to prevent out diffusion of the dopant. The dopant is activated simply by changing atmospheric gas during the temperature-declining interval.
申请公布号 KR100257757(B1) 申请公布日期 2000.06.01
申请号 KR19970075030 申请日期 1997.12.27
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD. 发明人 OH, JAE-GEUN;LEE, JUNG-HO
分类号 H01L21/337;(IPC1-7):H01L21/337 主分类号 H01L21/337
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