发明名称 |
METHOD FOR PREVENTING AN OUT DIFFUSION OF DOPANT IN AN ULTRA SHALLOW JUNCTION |
摘要 |
PURPOSE: An ultra shallow junction film preparing method is provided to obtain a high quality ultra shallow junction by preventing the increase of surface resistance of the junction. CONSTITUTION: Dopant is selectively implanted on a semiconductor plate(21). The dopant is activated with a thermal process having temperature-rising interval, temperature-maintaining interval and a temperature-declining interval. A nitride film(28) is formed on the surface of a region doped with the dopant during the temperature-declining interval in order to prevent out diffusion of the dopant. The dopant is activated simply by changing atmospheric gas during the temperature-declining interval.
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申请公布号 |
KR100257757(B1) |
申请公布日期 |
2000.06.01 |
申请号 |
KR19970075030 |
申请日期 |
1997.12.27 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD. |
发明人 |
OH, JAE-GEUN;LEE, JUNG-HO |
分类号 |
H01L21/337;(IPC1-7):H01L21/337 |
主分类号 |
H01L21/337 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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