发明名称 DEVICE AND METHOD FOR AUTOMATIC CALIBRATION OF MICROELECTROMECHANICAL STRUCTURE INCLUDED IN CONTROL LOOP
摘要 PROBLEM TO BE SOLVED: To at least partially overcome a conventional defect. SOLUTION: A sensing device 50' comprises a microelectromechanical structure, and a control loop 53' for controlling the microelectromechanical structure. The microelectromechanical structure comprises a stator element and a rotor element coupled together. The control loop 53' comprises a position interface 56 supplying a position signal VOUT indicative of the position of the rotor element and a one-bit quantizer 66 receiving the position signal VOUT and supplying a corresponding bit sequence OUT. The sensing device 50' comprises calibration devices 84 and 86 for calibrating the microelectromechanical structure and including a microactuator coupled to the rotor element and driving circuits 84 and 86 for driving the microactuator, and receiving the bit sequence OUT and supplying a driving signal VCAL correlated to a mean value MBS of the bit sequencer OUT to the microactuator in a given time window.
申请公布号 JP2002202320(A) 申请公布日期 2002.07.19
申请号 JP20010347845 申请日期 2001.11.13
申请人 STMICROELECTRONICS SRL 发明人 CHIESA ENRICO
分类号 G01D3/028;G01D3/06;G01P15/00;G01P15/08;G01P15/125;G01P15/13;G01P21/00 主分类号 G01D3/028
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