发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PURPOSE:To prevent leads from peeling from a package and to make it possible to prevent a reduction in the humidity resistance of a semiconductor device by a method wherein a barrier resin film is interposingly provided on the interfacial boundaries between the inner lead parts of the leads and the package. CONSTITUTION:The parts between adjacent leads 9 and 9 of each dam member 6 substantially constitute dams 6a for damming the flow of a resin and a PIQ layer 10 is interposed on the interfacial boundaries between the surfaces of inner lead parts 9a of the leads 9 and a package 14 as a barrier resin layer by forming the barrier resin layer (PIQ layer) 10 consisting of a polyimide isoindolo quinazolinedione on the surface regions of the inner lead parts 9a of the leads 9 except wire bonding parts. This layer 10 shows a good adhesion to any material for the leads 9 and the package 14, is bonded strongly to both of the leads 9 and the package 14 and has a high degree of flexibility.
申请公布号 JPH01161856(A) 申请公布日期 1989.06.26
申请号 JP19870321046 申请日期 1987.12.18
申请人 HITACHI LTD 发明人 HAIJIMA MIKIO
分类号 H01L23/28;H01L23/50 主分类号 H01L23/28
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