发明名称 Method for manufacturing poly-crystal sillicon having high resistance
摘要 Method for manufacturing polycrystalline silicon having high resistance, having a first step for depositing a polycrystalline silicon layer for a resistor area over a silicon semiconductor substrate; a second step for growing a first thermal oxide layer having a first specified depth over the polycrystalline silicon layer, ion-implanting with the nitrogen thereon, and growing a second thermal oxide layer having a second specified depth on the ion-implanted layer; a third step for forming a resistor pattern of the polycrystalline silicon with a photo etching method; and a fourth step for ion-implanting impurities in order to decrease the resistance of the polycrystalline silicon as contact regions to be used in resistance contacts with a fixed semiconductor region on the substrate.
申请公布号 US4965214(A) 申请公布日期 1990.10.23
申请号 US19880224810 申请日期 1988.07.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, KYU H.;LEE, JUNG H.;LEE, HEYUNG-SUB;YOOK, TAE-YOON;BAE, DONG-JOO
分类号 H01L27/10;H01L21/02;H01L21/822;H01L21/8244;H01L27/04;H01L27/11 主分类号 H01L27/10
代理机构 代理人
主权项
地址