发明名称 |
Time domain reflectometry tester for X-Y prober |
摘要 |
<p>A printed circuit board tester for testing matched impedance test sites on a printed circuit board comprising an x-y prober having a first prober head and a second prober head above the printed circuit board connected to a time domain reflectometer by a coaxial test cable. A signal probe is attached to one of the prober heads. The test cable includes a signal wire which is electrically connected to the signal probe and includes a ground shield electrically connected to a ground shield extender positioned around the signal probe. A separate ground probe is connected to the second prober head and includes a ground spring for temporarily contacting the ground shield extender to transmit ground signals to the ground shield of the test cable. <IMAGE></p> |
申请公布号 |
EP0953844(A2) |
申请公布日期 |
1999.11.03 |
申请号 |
EP19990300775 |
申请日期 |
1999.02.02 |
申请人 |
DELAWARE CAPITAL FORMATION, INC. |
发明人 |
SWART, MARK A. |
分类号 |
G01R31/28;G01R1/06;G01R27/04;G01R31/02;G01R31/11;H05K3/00;(IPC1-7):G01R1/067 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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