Apparatus and method for the optical characterization of the structure and composition of a light scattering sample

摘要

PCT No. PCT/EP95/02967 Sec. 371 Date Jan. 30, 1997 Sec. 102(e) Date Jan. 30, 1997 PCT Filed Jul. 27, 1995 PCT Pub. No. WO96/04545 PCT Pub. Date Feb. 15, 1996Apparatus for the optical characterization of the internal structure and/or composition of a spatially extended, scattering sample comprising an arrangement of one or several light sources and one or several light detectors and a displacement sensor.