发明名称 EXPOSURE MASK
摘要 <p>PROBLEM TO BE SOLVED: To provide an exposure mask capable of faithfully transferring a pattern using a constant amount of light, while improving the resolution limit of a transfer apparatus. SOLUTION: A mask pattern with a standardized dimension from 0.34 to 0.68, formed by a semitransparent phase shifter is disposed on a mask pattern made of shield material so as to be protruded from the edge of the mask pattern made of shield material.</p>
申请公布号 JP2002162728(A) 申请公布日期 2002.06.07
申请号 JP20010359863 申请日期 2001.11.26
申请人 TOSHIBA CORP 发明人 TANAKA YOKO;NAKASE MAKOTO;SATO TAKASHI;HAZAMA HIROAKI;KOMANO HARUKI
分类号 G03F1/29;G03F1/32;G03F1/68;H01L21/027;(IPC1-7):G03F1/08 主分类号 G03F1/29
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