发明名称 SURFACE UNEVEN CONFIGURATION DETECTOR
摘要 PROBLEM TO BE SOLVED: To provide a surface uneven configuration detector using a fiber optical plate excellent in light emission characteristic and having high detecting accuracy. SOLUTION: The detector is composed of: a first plate 2 which is formed by integrally bundling a plurality of optical fibers 21 and which is provided with a light-incident surface 22 and a light-emitting surface 23 formed obliquely to the optical axis of the optical fibers 21 and made parallel to each other; a second plate 3 which is formed by integrally bundling a plurality of optical fibers 31, which is provided with a light-incident surface 32 and a light-emitting surface 33 formed obliquely to the optical axis of the optical fibers 31 and made parallel to each other, and which is made a large numerical aperture to the first plate 2, with the light-incident surface 32 joined to the light-emitting surface 23 of the first plate 2; and an imaging element 4 which detects the light image emitted from this second plate 3. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006227654(A) 申请公布日期 2006.08.31
申请号 JP20060140688 申请日期 2006.05.19
申请人 HAMAMATSU PHOTONICS KK 发明人 SUGAWARA TAKEO
分类号 G02B6/04 主分类号 G02B6/04
代理机构 代理人
主权项
地址