| 摘要 |
A means and method for memory characterisation is disclosed. The memory characterisation means (1) is coupled between a computer system under test (2) and the memory (3) that constitutes the device under test. By generating trigger signatls for use by a measurement system (4), e.g. a logic analyser or an ate, events around the data strobe time of the memory can characterised. For example, the address access time or output enable access time can be measured. In a preferred embodiment, a read access control signal is detected by the characterisation means, and the data output of the device under test is compared with the data output of a reference memory after a variably delayed period of time, whereupon a trigger signal is generated when the data does not match. |
