发明名称 |
Polysilicon resistor structure having modified oxide layer |
摘要 |
Various embodiments include resistor structures. Particular embodiments include a resistor structure having multiple oxide layers, at least one of which includes a modified oxide. The modified oxide can aid in controlling the thermal capacitance and the thermal time constant of the resistor structure, or the thermal dissipation within the resistor structure. |
申请公布号 |
US9385087(B2) |
申请公布日期 |
2016.07.05 |
申请号 |
US201314057084 |
申请日期 |
2013.10.18 |
申请人 |
GLOBALFOUNDRIES INC. |
发明人 |
Chakraborty Debarsi;Chatterjee Aveek N. |
分类号 |
H01L23/538;H01L49/02;H01L23/522 |
主分类号 |
H01L23/538 |
代理机构 |
Hoffman Warnick LLC |
代理人 |
LeStrange Michael;Hoffman Warnick LLC |
主权项 |
1. A resistor structure comprising:
a first oxide layer; a first lateral contact layer overlying the first oxide layer, the first lateral contact layer including:
a polysilicon region overlying a first portion of the first oxide layer; andat least one contact region coplanar with the polysilicon region and overlying a second portion of the first oxide layer distinct from the first portion of the first oxide layer; a second oxide layer overlying the first lateral contact layer; a first via contacting the at least one contact region and contacting the second oxide layer; a first contact pad overlying the first via and contacting the second oxide layer; a second via contacting the first contact pad and contacting the second oxide layer; and a second contact pad overlying the second via and the second oxide layer, wherein at least one of the first oxide layer or the second oxide layer includes a modified oxide for controlling at least one of a resistance of the resistor structure or a thermal dissipation within the resistor structure, the modified oxide including a silicon-on-insulator (SOI) oxide material including an OH group. |
地址 |
Grand Cayman KY |