发明名称 |
TRANSFORMER TESTING DEVICE, AND METHOD FOR TESTING A TRANSFORMER |
摘要 |
A transformer testing device (10) comprises outputs (31-33) for detachably connecting the transformer testing device to windings of multiple phases of a transformer (50). The transformer testing device (10) further comprises a plurality of sources (21-23), each of which is designed to generate a test signal. The transformer testing device (10) also comprises a switching matrix (40) that is connected between the plurality of sources (21-23) and the outputs (31-33). |
申请公布号 |
WO2016113072(A1) |
申请公布日期 |
2016.07.21 |
申请号 |
WO2015EP80496 |
申请日期 |
2015.12.18 |
申请人 |
OMICRON ELECTRONICS GMBH |
发明人 |
FLAX, DIRK;PÜTTER, MARKUS |
分类号 |
G01R31/02;H02P13/00 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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