发明名称 TRANSFORMER TESTING DEVICE, AND METHOD FOR TESTING A TRANSFORMER
摘要 A transformer testing device (10) comprises outputs (31-33) for detachably connecting the transformer testing device to windings of multiple phases of a transformer (50). The transformer testing device (10) further comprises a plurality of sources (21-23), each of which is designed to generate a test signal. The transformer testing device (10) also comprises a switching matrix (40) that is connected between the plurality of sources (21-23) and the outputs (31-33).
申请公布号 WO2016113072(A1) 申请公布日期 2016.07.21
申请号 WO2015EP80496 申请日期 2015.12.18
申请人 OMICRON ELECTRONICS GMBH 发明人 FLAX, DIRK;PÜTTER, MARKUS
分类号 G01R31/02;H02P13/00 主分类号 G01R31/02
代理机构 代理人
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