INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM FOR INSPECTION DEVICE

摘要

PROBLEM TO BE SOLVED: To provide an inspection device that corrects deformation of an image to be inspected and accurately inspect the inspection target.SOLUTION: The method according to the present application includes the steps of: acquiring a reference image with the same print information as the print information printed on an inspection target (S1 to S3); extracting a plurality of reference feature points from the reference image (S4); acquiring an inspection image of the inspection target from imaging means (S5); extracting a plurality of inspection feature points from the inspection image (S6); obtaining displacement in an imaging direction of the imaging means from the reference feature points and their corresponding inspection feature points and calculating the three-dimensional shape of the inspection target (S7); correcting the inspection image according to the three-dimensional shape (S8); and inspecting the inspection target based on the corrected inspection image (S9).SELECTED DRAWING: Figure 4