发明名称 THREE-DIMENSIONAL MEMORY DEVICE WITH STRESS COMPENSATION LAYER WITHIN A WORD LINE STACK
摘要 A first stack of alternating layers including first insulating layers and first sacrificial material layers is formed on a substrate. Dielectric oxide layers applying compressive stress are formed on the top surface of the first stack and on the bottom surface of the substrate. A second stack of alternating layers including second insulating layers and second sacrificial material layers is formed over the top dielectric oxide layer. After formation of lateral recesses by removal of the first and second sacrificial material layers, a bottom dielectric oxide layer is removed. A conductive material applying a tensile stress is deposited into the backside recesses to form electrically conductive layers. The compressive stress applied by the top dielectric oxide layer partially cancels the tensile stress applied by the electrically conductive layers, and reduces the curvature of the substrate that has a concave bottom surface.
申请公布号 WO2016137551(A1) 申请公布日期 2016.09.01
申请号 WO2015US62775 申请日期 2015.11.25
申请人 SANDISK TECHNOLOGIES LLC 发明人 XU, Jiyin
分类号 H01L27/115 主分类号 H01L27/115
代理机构 代理人
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