发明名称 |
Lumber defect scanning including multi-dimensional pattern recognition |
摘要 |
Grain defect scanning takes into account a broad set of data representing both wood grain structure and wood grain image to provide a multi-dimensional scan vector for an inspection point with wide variation therein relative to defect types. A library of similarly structured multi-dimensional training set vectors developed during a preliminary training session with known defect types is referenced by multivariate pattern recognition analysis to classify a collection of scan vectors associated with an article under inspection. By statistically matching scan vectors with training set vectors under pattern recognition analysis, physical locations on a wood article are identified according to known defect types.
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申请公布号 |
US5703960(A) |
申请公布日期 |
1997.12.30 |
申请号 |
US19960714632 |
申请日期 |
1996.09.16 |
申请人 |
U.S. NATURAL RESOURCES, INC. |
发明人 |
SOEST, JON F. |
分类号 |
G01N21/898;G01N33/46;(IPC1-7):G06K9/00 |
主分类号 |
G01N21/898 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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