发明名称 METHOD OF AND APPARATUS FOR MEASURING THICKNES OF A LAYER
摘要 PCT No. PCT/CH93/00238 Sec. 371 Date Jun. 13, 1994 Sec. 102(e) Date Jun. 13, 1994 PCT Filed Oct. 6, 1993 PCT Pub. No. WO94/10530 PCT Pub. Date May 11, 1994A method for measuring the thickness of a layer of pasty or dough-like material on a moving surface (5) wherein a movably supported measuring roll is contacted with the layer and wherein during the movement of the surface provided with the layer the deflection of the measuring roll crosswise to the moving direction of the surface is detected with a sensor generating an output signal, whereat a parameter of this output signal is in a functional relationship with the magnitude of the deflection of the measuring roll, or of the thickness of the layer, respectively. To maintain the accuracy and to prevent the coiling up of the layer to be measured on the measuring roll, a defined braking force is exerted thereon.
申请公布号 PL173114(B1) 申请公布日期 1998.01.30
申请号 PL19930304297 申请日期 1993.10.06
申请人 BUEHLER AG 发明人 GREMINGER HANSUELI;SCHOENENBERGER NIKLAUS
分类号 B02C4/32;B02C4/36;B02C23/00;G01B5/06;G01B21/08 主分类号 B02C4/32
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