发明名称 TESTING SYSTEM FOR TERMINAL EQUIPMENT
摘要 PURPOSE:To connect a testing function and a terminal equipment to be tested automatically without obstructing communication with other terminal equipment and to enable reduction of time and expenses by placing the testing function of the terminal equipment on an exchange side. CONSTITUTION:At first a terminal equipment to be tested is grasped. An exchange side switches a switching circuit (SW) 5 to (2) to perform succeeding transmission and receiving of signals to and from the terminal equipment to be tested by a terminal testing device (TSTE) 6. At the same time, the exchange side notifies the terminal equipment to be tested that switching is to be made to the testing state. The terminal equipment to be tested discriminates information from the exchange side that it is test connection by a signal processing circuit (SIG) 13 and changes a switching circuit (SW) 14 to (2). Then, a signal for testing is sent from the exchange side to the terminal equipment to be tested. A test circuit (TEST) 16 of the terminal equipment to be tested receives above-mentioned signal, and, for instance, if it is an automatic terminal, sends back a signal corresponding to the signal sent from the exchange side. The terminal testing device (TSTE) 6 of the exchange side compares the signal sent from the exchange to the terminal equipment to be tested with the signal sent from the terminal equipment to be tested, and checks whether the terminal equipment to be tested is operating normally.
申请公布号 JPS61216557(A) 申请公布日期 1986.09.26
申请号 JP19850055675 申请日期 1985.03.22
申请人 OKI ELECTRIC IND CO LTD 发明人 YAMADA HAJIME;KISHINO NORIAKI;NAKAMURA HITOYA
分类号 H04M1/24;H04M3/30 主分类号 H04M1/24
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