发明名称 TEST CLOCK SUPPLYING SYSTEM
摘要 PURPOSE:To make it possible to omit manual operation by switching an external test clock by means of an automatic testing machine at the time of testing a printed circuit board. CONSTITUTION:Since the potential of a selecting terminal 4-1 is usually held at an 'H' level by a pull-up resistor R, a switch 4 is held as shown by the sold line and a clock (7MHz) oscillated from a clock oscillator 2 is supplied to an internal control circuit 5 through the switch 4. At the time of executing a test, a test rod in the automatic testing machine comes into contact with a wiring connected to the terminal 4-1 and turns the potential of the terminal 4-1 to zero, so that the switch 4 is switched as shown by the dotted line and a test clock inputted from the other test rod to a test clock input terminal 3 is supplied to the circuit 5 through the switch 4. While controlling the test clock, a test signal is extracted from the wiring on a prescribed position of the circuit 5 by the other test rod to execute the operation test of the circuit 5.
申请公布号 JPH01292440(A) 申请公布日期 1989.11.24
申请号 JP19880122437 申请日期 1988.05.19
申请人 FUJITSU LTD 发明人 MITSUISHI KAZUYUKI;HIGASHIURA YASUYUKI
分类号 G06F11/22;G06F1/04 主分类号 G06F11/22
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