发明名称 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
摘要 In a semiconductor device having a trench isolation structure, after a trench surface is selectively oxidized by a conventional method, an oxidation prevention film is removed, the entire surface of the substrate is again oxidized while only an oxide film on the substrate or trench surface is exposed, and a radius of curvature is provided to the shape of the oxide film near the trench upper end portion.
申请公布号 WO9812742(A1) 申请公布日期 1998.03.26
申请号 WO1997JP03267 申请日期 1997.09.16
申请人 HITACHI, LTD.;MIURA, HIDEO;KITANO, MAKOTO;IKEDA, SHUJI;SUZUKI, NORIO 发明人 MIURA, HIDEO;KITANO, MAKOTO;IKEDA, SHUJI;SUZUKI, NORIO
分类号 H01L21/76;H01L21/762;(IPC1-7):H01L21/762 主分类号 H01L21/76
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