发明名称 DRAM ARCHITECTURE WITH COMBINED SENSE AMPLIFIER PITCH
摘要 A memory architecture, suitable for a dynamic random access memory (DRAM) reduces layout area by sharing sense amplifiers, and arranging sense amplifiers to minimize die area. The sense amplifiers, comprising N-sense and P-sense amplifiers, are laid out in a region between memory array portions having memory cells that are each coupled to a digit line in a plurality of alternatingly sequenced digit line pairs. Each region has one N-sense amplifier for every two digit line pairs, and one P-sense amplifier for each digit line pair. Each N-sense amplifier is shared between two memory array portions, and is separated from each by an NFET isolation switch. Each P-sense amplifier is neither shared between the two memory array portions, nor separated from its corresponding memory array portion by an NFET isolation switch.
申请公布号 WO9833185(A1) 申请公布日期 1998.07.30
申请号 WO1998US00403 申请日期 1998.01.12
申请人 MICRON TECHNOLOGY, INC. 发明人 SHIRLEY, BRIAN, M.
分类号 G11C11/401;G11C7/06;G11C11/4091;G11C11/4097;(IPC1-7):G11C11/409 主分类号 G11C11/401
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