发明名称 |
Process apparatus and method for improved plasma processing of a substrate |
摘要 |
A processing system for processing a substrate comprises a process chamber having a top, a bottom, and a sidewall for defining a process space therein. The process chamber has an opening in the sidewall thereof for providing access to the process space. A plasma-generating assembly is coupled with the process chamber for creating a plasma within the process space. A substrate support assembly is configured for coupling with the process chamber to support a substrate within the process space. The substrate support assembly extends into the process space through the sidewall opening in the process chamber and seals the sidewall opening to generally isolate the process space from atmosphere.
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申请公布号 |
US6395095(B1) |
申请公布日期 |
2002.05.28 |
申请号 |
US19990334046 |
申请日期 |
1999.06.15 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
JONES WILLIAM D.;ROWAN ROBERT C.;SILL EDWARD L.;LICATA THOMAS J. |
分类号 |
H01L21/302;H01J37/32;H01L21/205;H01L21/30;H01L21/304;H01L21/3065;(IPC1-7):C23C16/00 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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