发明名称 Semiconductor device and method of manufacturing the same
摘要 A semiconductor device has a gate electrode formed on P type semiconductor substrate through a gate insulation film, a low concentration N- type drain region formed so as to be adjacent to the gate electrode, a high concentration N+ type drain region separated from the other end of said gate electrode and included in said low N- type drain region, and a middle concentration N type layer having high impurity concentration peak at a position of the predetermined depth in said substrate at a region spanning at least from said gate electrode to said high concentration N+ type drain region, and formed so that high impurity concentration becomes low at a region near surface of the substrate.
申请公布号 US2002094642(A1) 申请公布日期 2002.07.18
申请号 US20010829258 申请日期 2001.04.09
申请人 KIKUCHI SHUICHI;NISHIBE EIJI;SUZUKI TAKUYA 发明人 KIKUCHI SHUICHI;NISHIBE EIJI;SUZUKI TAKUYA
分类号 H01L21/265;H01L21/336;H01L29/78;(IPC1-7):H01L21/336 主分类号 H01L21/265
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