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发明名称
A method to reduce leakage during a semi-conductor burn-in procedure
摘要
申请公布号
AU2002247468(A1)
申请公布日期
2002.10.21
申请号
AU20020247468
申请日期
2002.04.02
申请人
SUN MICROSYSTEMS, INC.
发明人
BAN P. WONG
分类号
C12M1/34;G01N33/50;G01R31/27;G01R31/28;(IPC1-7):G01R31/316
主分类号
C12M1/34
代理机构
代理人
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地址
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