发明名称 Method and apparatus for fault tracing in electronic measurement and test arrangements for electrochemical elements
摘要 In a method for fault tracing in automatically operating electronic measurement and test arrangements for a large number of electrochemical elements, cell simulators are inserted into the holders which are provided for the electrochemical elements. The external shape and size, including the electrical connections, of these cell simulators simulate an electrochemical element. They contain test electronics, whose behaviour with inverse polarity differs to a major extent from the behaviour with polarity based on the application. One cell simulator is activated and has a measurement current applied to it. The voltage and/or the voltage response on the cell simulator are/is then measured and are/is compared with the nominal voltage value predetermined for this cell simulator. The test electronics comprise at least a resistor and a diode connected in parallel.
申请公布号 US2004183541(A1) 申请公布日期 2004.09.23
申请号 US20030704783 申请日期 2003.11.10
申请人 VARTA MICROBATTERY GMBH, A CORPORATION OF GERMANY 发明人 HALD RAINER;HAUG PETER;ILIC DEJAN;WALLKUM WILLI;BIRKE PETER
分类号 G01R31/36;G01R35/00;H01M10/48;(IPC1-7):G01N27/416 主分类号 G01R31/36
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