发明名称 Increased-contrast film for high-transmittance attenuated phase-shaft masks
摘要 An increased-contrast film for high-transmittance attenuated phase-shift masks (PSM's) is disclosed. A high-transmittance attenuated PSM includes a clear substrate, a shifter film selectively covering the clear substrate, and an increased-contrast film covering the shifter film to aid inspection of the PSM. The increased-contrast film may be removable, and may be photoresist. The increased-contrast film is preferably non-reactive to light used during the inspection of the PSM.
申请公布号 US6858353(B2) 申请公布日期 2005.02.22
申请号 US20020196974 申请日期 2002.07.17
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD 发明人 CHANG CHIA-YANG;HSU TYNG-HAO;HUNG CHANG-CHENG;LIN CHIN-HSIANG
分类号 G03F1/00;G03F1/14;(IPC1-7):G03F9/00 主分类号 G03F1/00
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