发明名称 |
Increased-contrast film for high-transmittance attenuated phase-shaft masks |
摘要 |
An increased-contrast film for high-transmittance attenuated phase-shift masks (PSM's) is disclosed. A high-transmittance attenuated PSM includes a clear substrate, a shifter film selectively covering the clear substrate, and an increased-contrast film covering the shifter film to aid inspection of the PSM. The increased-contrast film may be removable, and may be photoresist. The increased-contrast film is preferably non-reactive to light used during the inspection of the PSM.
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申请公布号 |
US6858353(B2) |
申请公布日期 |
2005.02.22 |
申请号 |
US20020196974 |
申请日期 |
2002.07.17 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD |
发明人 |
CHANG CHIA-YANG;HSU TYNG-HAO;HUNG CHANG-CHENG;LIN CHIN-HSIANG |
分类号 |
G03F1/00;G03F1/14;(IPC1-7):G03F9/00 |
主分类号 |
G03F1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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