| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method for analyzing the composition of an optical disk target, especially the composition of an Ag-In-Te-Sb-based or Ag-In-Te-Ge-Sb-based target material and capable of improving analysis precision and analyzing the composition in a short time by using a fluorescent X-ray (XRF) method instead of a wet method, speedily and accurately creating a calibration curve, and appropriately preparing a sample of the optical disk (recording film) target material. <P>SOLUTION: In the method for analyzing the composition of the optical disk target by fluorescent X-rays, the optical disk target sample is pulverized by a cyclone mill into grain diameters of 0.9-1.2μm on a BET (specific surface area) basis. Pulverized power is press-molded into a size of 20 mmϕor less to be a sample for composition analysis. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
