发明名称 GATE ARRAY TESTER
摘要 PURPOSE:To simplify the hardware constitution of a gate array tester by giving a shifting function to a buffer register and transmitting and receiving signals between a tester body and a performance board in units of a number of shift bits. CONSTITUTION:The output of each pin of an LSI10 to be measured of a gate array chip is stored in a corresponding bit position of a buffer register 31 in a performance board 30. Since this register 31 has the shifting function, information of every bit outputted successively from the buffer 31 is applied to a tester body 20 through control boards 321, 322..., a driver/receiver circuit 33, etc. of the board 30. Thus, the hardware constitution of the performance board of the gate array tester is simplified.
申请公布号 JPS59154375(A) 申请公布日期 1984.09.03
申请号 JP19830029715 申请日期 1983.02.24
申请人 TOSHIBA KK 发明人 KINOSHITA TSUNEO
分类号 G01R31/28;G01R31/317;G01R31/3185 主分类号 G01R31/28
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