发明名称 Method of producing silicon layer having surface controlled to be uneven or even
摘要 A method of forming a silicon layer disclosed herein includes the steps of depositing an amorphous silicon layer on a substrate, irradiating a silane gas to the substrate, and performing an annealing process in a high vacuum or in an inert gas. The amorphous silicon layer is thereby converted into a silicon layer having an uneven surface caused by hemispherical or spherical silicon grains. The annealing process may be performed while irradiating a hydrogen gas or an oxidizing gas. In this case, such a silicon layer that has an even surface is formed.
申请公布号 US5910019(A) 申请公布日期 1999.06.08
申请号 US19970829358 申请日期 1997.04.02
申请人 NEC CORPORATION 发明人 WATANABE, HIROHITO;HONMA, ICHIRO
分类号 H01L21/285;H01L21/02;H01L21/205;H01L21/28;H01L21/822;H01L21/8242;H01L21/8244;H01L27/04;H01L27/10;H01L27/108;H01L27/11;(IPC1-7):H01L21/00 主分类号 H01L21/285
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