发明名称 ENHANCED SAMPLE PROCESSING DEVICES, SYSTEMS AND METHODS
摘要 Devices, systems, and methods for processing sample materials. The sample materials may be located in a plurality of process chambers in the device, which is in the form of a disk, rotated during heating of the sample materials. The temperature of the disk may be controlled by directing electromagnetic energy at its bottom surface while rotating it. Sample materials may be moved betwwen process chambers using centrifugal force.</SD OAB>
申请公布号 CA2412275(A1) 申请公布日期 2002.01.03
申请号 CA20012412275 申请日期 2001.06.28
申请人 3M INNOVATIVE PROPERTIES COMPANY 发明人 BEDINGHAM, WILLIAM;RAJAGOPAL, RAJ;SESHADRI, KANNAN;ROBOLE, BARRY W.
分类号 B01L3/00;B01L7/00;F27B9/16;F27D5/00;G01N35/00;(IPC1-7):B01L7/00;B01J19/00;G01N21/07;C12Q1/68 主分类号 B01L3/00
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