| 摘要 |
PURPOSE:To perform high resolution measurement by driving the same probe by a pulse wave with a pick-up pulse of a burst wave as a reference, and setting a burst wave measuring gate position by considering an error between the first peaks of the burst wave and the pulse wave. CONSTITUTION:The same focus type probe 3 is used, and the same probe 3 is driven by a pulse wave with a pick-up pulse from a pick-up pulse generating circuit 43a of a burst wave transmitter 43 as a reference. Thereby, an error between the first peak of a signal of a burst wave and the first peak of a signal of a pulse wave in a defect echo receiving signal becomes a dislocation quantity of a defect echo generating position. This dislocation quantity is corrected by a gate position adjusting circuit 5a, and a burst wave measuring gate position is set, and a gate width or a measuring position is set with a gate width or a measuring position found in pulse wave measurement as a reference. Thereby, a gate position adjusting range in burst wave measurement can be narrowed, and a high resolution image is simply obtained. |
