发明名称 |
MICROWAVE-ASSISTED MOIRÉ DEFLECTOMETRY |
摘要 |
An apparatus includes: (1) a series of gratings configured to block ballistic trajectories through the gratings; (2) an analyte gas source positioned upstream of the gratings, and configured to emit a beam of gas phase molecules; (3) a deflection field generator configured to apply a deflection field in a region of the gratings, the deflection field configured to selectively deflect a subset of the molecules to allow their transmission through the gratings; and (4) a detector positioned downstream of the gratings, and configured to detect transmitted molecules. |
申请公布号 |
WO2016090238(A1) |
申请公布日期 |
2016.06.09 |
申请号 |
WO2015US63980 |
申请日期 |
2015.12.04 |
申请人 |
PRESIDENT AND FELLOWS OF HARVARD COLLEGE |
发明人 |
PATTERSON, DAVID S.;DOYLE, JOHN M. |
分类号 |
H01J49/02;H01J49/04;H01J49/06 |
主分类号 |
H01J49/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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