发明名称 MICROWAVE-ASSISTED MOIRÉ DEFLECTOMETRY
摘要 An apparatus includes: (1) a series of gratings configured to block ballistic trajectories through the gratings; (2) an analyte gas source positioned upstream of the gratings, and configured to emit a beam of gas phase molecules; (3) a deflection field generator configured to apply a deflection field in a region of the gratings, the deflection field configured to selectively deflect a subset of the molecules to allow their transmission through the gratings; and (4) a detector positioned downstream of the gratings, and configured to detect transmitted molecules.
申请公布号 WO2016090238(A1) 申请公布日期 2016.06.09
申请号 WO2015US63980 申请日期 2015.12.04
申请人 PRESIDENT AND FELLOWS OF HARVARD COLLEGE 发明人 PATTERSON, DAVID S.;DOYLE, JOHN M.
分类号 H01J49/02;H01J49/04;H01J49/06 主分类号 H01J49/02
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