发明名称 CIS image sensors with epitaxy layers and methods for forming the same
摘要 A method includes performing a first epitaxy to grow a first epitaxy layer of a first conductivity type, and performing a second epitaxy to grow a second epitaxy layer of a second conductivity type opposite the first conductivity type over the first epitaxy layer. The first and the second epitaxy layers form a diode. The method further includes forming a gate dielectric over the first epitaxy layer, forming a gate electrode over the gate dielectric, and implanting a top portion of the first epitaxy layer and the second epitaxy layer to form a source/drain region adjacent to the gate dielectric.
申请公布号 US9368540(B2) 申请公布日期 2016.06.14
申请号 US201414525525 申请日期 2014.10.28
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 JangJian Shiu-Ko;Hong Min Hao;Chen Kei-Wei;Jeng Chi-Cherng
分类号 H01L27/148;H01L27/146;H01L31/103;H01L31/18;H01L29/16;H01L31/028 主分类号 H01L27/148
代理机构 Slater Matsil, LLP 代理人 Slater Matsil, LLP
主权项 1. A device comprising: a photo diode comprising: a first semiconductor layer of a first conductivity type; anda second semiconductor layer over the first semiconductor layer and of a second conductivity type opposite to the first conductivity type; a silicon germanium layer of the second conductivity type underlying the first semiconductor layer; a gate dielectric over the second semiconductor layer; a gate electrode over the gate dielectric; and a source/drain region of the first conductivity type, wherein the source/drain region, the gate dielectric, and the gate electrode form portions of a transistor, and the transistor is configured to turn on and turn off an electrical connection between the photo diode and the source/drain region.
地址 Hsin-Chu TW
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