发明名称 |
Apparatus and method for analog-digital converting |
摘要 |
Provided is an apparatus for analog-digital converting that includes a Most Significant Bit (MSB)-Digital Analog Converter (DAC) for converting a digital signal into an analog signal, a trim capacitor, a Least Significant Bit (LSB)-DAC, coupled to the trim capacitor, for converting a digital signal into an analog signal, a bridge capacitor connecting the MSB-DAC and the LSB-DAC, a comparator for measuring a voltage value at the MSB-DAC and LSB-DAC and outputting a result of comparing with a sampled voltage value, and a controller for generating first measurement data by digital converting a first measurement value output from the comparator by applying a reference voltage to a unit capacitor of the MSB-DAC, for generating second measurement data by digital converting a second measurement value output from the comparator by applying the reference voltage to the LSB-DAC, and controlling the trim capacitor by comparing the first and second measurement data. |
申请公布号 |
US9432037(B2) |
申请公布日期 |
2016.08.30 |
申请号 |
US201514924949 |
申请日期 |
2015.10.28 |
申请人 |
Samsung Electronics Co., Ltd |
发明人 |
Oh Seung-Hyun;Lee Jong-Woo;Cho Thomas Byung-Hak |
分类号 |
H03M1/06;H03M1/12;H03M1/66;H03M1/80;H03M1/00 |
主分类号 |
H03M1/06 |
代理机构 |
The Farrell Law Firm, P.C. |
代理人 |
The Farrell Law Firm, P.C. |
主权项 |
1. An apparatus for analog-to-digital conversion, the apparatus comprising:
a most significant bit digital-to-analog converter (MSB-DAC) for converting a first digital signal into a first analog signal; a least significant bit digital-to-analog converter (LSB-DAC) for converting a second digital signal into a second analog signal; a bridge capacitor for connecting the MSB-DAC and the LSB-DAC; a comparator for measuring a voltage value corresponding to a combination of the MSB-DAC and the LSB-DAC, and for outputting a result of a comparison of the measured voltage value with a sample voltage value; and a controller for controlling analog-to-digital conversion of a first measurement value output from the comparator by applying a reference voltage to a unit capacitor of the MSB-DAC to generate first measurement data, and analog-to-digital conversion of a second measurement value output from the comparator by applying the reference voltage to the LSB-DAC to generate second measurement data. |
地址 |
KR |