发明名称 Second order correction in linearized proximity probe
摘要 A system for reducing higher order nonlinearities in the linearized output of a dimension gauging probe in which the dimension gauging probe provides an output varying inversely with the physical dimension gauged which is in turn linearized to a signal varying proportionally with the physical dimension. Higher order nonlinearities, an error condition, which deviate the correspondence between the gauged dimension and the output from a linear or straight-line function, are reduced by feedback of the linearized output to the probe and, preferably, by feedforward of a portion of the probe output signal to the linearized signal.
申请公布号 US4228392(A) 申请公布日期 1980.10.14
申请号 US19770840852 申请日期 1977.10.11
申请人 ADE CORPORATION 发明人 ABBE, ROBERT C.;PODUJE, NOEL S.;KLEIN, DANIEL
分类号 G01R27/26;(IPC1-7):G01R27/26 主分类号 G01R27/26
代理机构 代理人
主权项
地址