Event sequencer for automatic test equipment

摘要

A number of local sequencers, one for each pin of the device under test is disclosed. Each local sequencer is provided with a global clock, a global time zero signal indicating the clock edge for referencing the start of a test, and a period vernier indicating an offset from the clock for the start of the test period. Each local sequencer uses this information to generate its own test events referenced to the test period with individual calibration delays factored in locally. Each local sequencer is individually programmable so that different sequencers can provide different numbers of events during the same test period.