发明名称 DEPTH MEASUREMENT OF SLICKLINE
摘要 <p>A depth measuring system for a slickline utilized in a well bore operation where the slickline is in a non-slip relationship with the circumference of a calibrated measuring wheel and the revolutions of the wheel are utilized to provide a first length measurement. A load cell is provided to measure tension in the slickline so that length elongation of the slickline due to tension can be determined. A temperature differential determination is made so that corrections in length can be made for the temperature effects. The temperature differential can be temperature effects on the measuring wheel and/or temperature effects of the slickline in the well bore. The measuring wheel determination of length is algebraically summed with the tension elongation and changes due to temperature to provide a more accurate indication of the depth measurement in the well bore.</p>
申请公布号 CA2129391(A1) 申请公布日期 1996.02.04
申请号 CA19942129391 申请日期 1994.08.03
申请人 发明人 KERR, WAYNE L.
分类号 E21B47/04;G01B7/02;G01B7/26;(IPC1-7):E21B47/04;E21B47/09 主分类号 E21B47/04
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