发明名称 Method for fabricating MOS transistor having raised source and drain
摘要 A process for fabricating a semiconductor device comprising a raised source and drain. A semiconductor device is fabricated by a process comprising the following steps: forming active regions separated by isolation regions; forming at each active region a gate electrode structure; depositing a first dielectric layer and a second dielectric layer; removing the top portion of the second dielectric layer to expose the portion of the first dielectric layer that covers the gate electrode structure; forming on the substrate a patterned resist layer to mask portions of the second dielectric layer; forming trenches next to the gate electrode structure by removing the unmasked portions of the second dielectric layer; filling the trenches with a conductor; doping the conductor with dopants; and driving the dopants into the substrate to form the raised source and drain.
申请公布号 US6150244(A) 申请公布日期 2000.11.21
申请号 US19990467086 申请日期 1999.12.10
申请人 MOSEL VITELIC INC. 发明人 NI, CHENG-TSUNG
分类号 H01L21/225;H01L21/336;H01L21/60;(IPC1-7):H01L21/22 主分类号 H01L21/225
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