发明名称 METHOD FOR PROCESSING SEMICONDUCTOR WAFER AND SEMICONDUCTOR WAFER
摘要 In a method for processing a semiconductor wafer which comprises chamfering, lapping, etching, and mirror-polishing, the etching is alkali etching and then acid etching. The acid etching is executed with an acid etchant consisting of hydrofluoric acid, nitric acid, phosphoric acid, and water. In a method for processing a semiconductor wafer which comprises chamfering, surface grinding, etching, and mirror-polishing, the etching is executed as mentioned above. In a method for processing a semiconductor wafer which comprises planarizing, etching, and mirror-polishing, the etching is executed as mentioned above, and the mirror-polishing is executed by the acid etching, back polishing, and then surface polishing. Thus a semiconductor wafer which improves in the flatness, the surface roughness, and the condition of the wafer back.
申请公布号 WO0201616(A1) 申请公布日期 2002.01.03
申请号 WO2001JP05401 申请日期 2001.06.25
申请人 SHIN-ETSU HANDOTAI CO., LTD.;NIHONMATSU, TAKASHI;YOSHIDA, MASAHIKO;SASAKI, YOSHINORI;SAITOH, MASAHITO;TAKAKU, TOSHIAKI;KATO, TADAHIRO 发明人 NIHONMATSU, TAKASHI;YOSHIDA, MASAHIKO;SASAKI, YOSHINORI;SAITOH, MASAHITO;TAKAKU, TOSHIAKI;KATO, TADAHIRO
分类号 H01L21/304;H01L21/306;(IPC1-7):H01L21/304 主分类号 H01L21/304
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