发明名称 |
METHOD FOR PROCESSING SEMICONDUCTOR WAFER AND SEMICONDUCTOR WAFER |
摘要 |
In a method for processing a semiconductor wafer which comprises chamfering, lapping, etching, and mirror-polishing, the etching is alkali etching and then acid etching. The acid etching is executed with an acid etchant consisting of hydrofluoric acid, nitric acid, phosphoric acid, and water. In a method for processing a semiconductor wafer which comprises chamfering, surface grinding, etching, and mirror-polishing, the etching is executed as mentioned above. In a method for processing a semiconductor wafer which comprises planarizing, etching, and mirror-polishing, the etching is executed as mentioned above, and the mirror-polishing is executed by the acid etching, back polishing, and then surface polishing. Thus a semiconductor wafer which improves in the flatness, the surface roughness, and the condition of the wafer back. |
申请公布号 |
WO0201616(A1) |
申请公布日期 |
2002.01.03 |
申请号 |
WO2001JP05401 |
申请日期 |
2001.06.25 |
申请人 |
SHIN-ETSU HANDOTAI CO., LTD.;NIHONMATSU, TAKASHI;YOSHIDA, MASAHIKO;SASAKI, YOSHINORI;SAITOH, MASAHITO;TAKAKU, TOSHIAKI;KATO, TADAHIRO |
发明人 |
NIHONMATSU, TAKASHI;YOSHIDA, MASAHIKO;SASAKI, YOSHINORI;SAITOH, MASAHITO;TAKAKU, TOSHIAKI;KATO, TADAHIRO |
分类号 |
H01L21/304;H01L21/306;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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