发明名称 Methods for forming resistors for integrated circuit devices
摘要 Methods of forming an integrated circuit device may include forming an insulating layer on an integrated circuit substrate, forming a first conductive layer on the insulating layer, and forming a second conductive layer on the first conductive layer so that the first conductive layer is between the second conductive layer and the insulating layer. Moreover, the first conductive layer may be a layer of a first material, the second conductive layer may be a layer of a second material, and the first and second materials may be different. A hole may be formed in the second conductive layer so that portions of the first conductive layer are exposed through the hole. After forming the hole in the second conductive layer, the first and second conductive layers may be patterned so that portions of the first and second conductive layers surrounding portions of the first conductive layer exposed through the hole are removed while maintaining portions of the first conductive layer previously exposed through the hole.
申请公布号 US7262108(B2) 申请公布日期 2007.08.28
申请号 US20040961896 申请日期 2004.10.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK JE-MIN;HWANG YOO-SANG
分类号 H01L21/20;H01L27/04;H01L21/02;H01L21/768;H01L27/06 主分类号 H01L21/20
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