发明名称 Method of fabricating a trench capacitor DRAM device
摘要 The present invention discloses a STI-first process for making trench DRAM devices. According to the preferred embodiment, the etching recipe for etching the STI region in the memory array is completely compatible with the logic STI process.
申请公布号 US7271056(B2) 申请公布日期 2007.09.18
申请号 US20050160853 申请日期 2005.07.12
申请人 UNITED MICROELECTRONICS CORP. 发明人 SU YI-NAN
分类号 H01L21/8242 主分类号 H01L21/8242
代理机构 代理人
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