发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can inhibit deterioration in blocking breakdown voltage while functioning as a normally-off device and inhibit an increase in on-resistance.SOLUTION: A semiconductor device comprises an AlGaN layer 4 composed of a first AlGaN layer 4a and a second AlGaN layer 4b and the second AlGaN layer 4b on an upper layer side is formed only in vicinity of a gate structure. In addition, an Al mixed crystal ratio x of the first AlGaN layer 4a is made to be higher than an Al mixed crystal ratio y of the second AlGaN layer 4b. With this composition, the semiconductor device which can inhibit deterioration in blocking breakdown voltage while functioning as a normally-off device and inhibit an increase in on-resistance can be provided.SELECTED DRAWING: Figure 1
申请公布号 JP2016127089(A) 申请公布日期 2016.07.11
申请号 JP20140265668 申请日期 2014.12.26
申请人 DENSO CORP 发明人 KOYAMA KAZUHIRO;HIGUCHI YASUSHI;OSAWA SEIGO;MATSUI MASAKI;UMU YONSHIN
分类号 H01L21/338;H01L21/336;H01L29/06;H01L29/778;H01L29/78;H01L29/786;H01L29/812 主分类号 H01L21/338
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