发明名称 |
METHOD FOR FORMING A NANOWIRE STRUCTURE |
摘要 |
Disclosed is a method for forming a nanowire structure. The method for forming the nanowire structure comprises: a) step for forming a first semiconductor layer on a substrate; b) step for etching the first semiconductor layer to form a patterned first semiconductor layer; c) step for forming a dielectric layer on the patterned first semiconductor layer; and d) step for forming a second semiconductor layer on the patterned first semiconductor layer and the dielectric layer. The method for forming the nanowire structure comprises: e) step for repeating the a) step to the d) step at least once; f) step for repeating the a) step to the c) step after the e) step once; g) step for etching the patterned first semiconductor layer, the dielectric layer, and the second semiconductor layer to form a pin structure; and h) step for removing the patterned first semiconductor layer from the pin structure. |
申请公布号 |
KR20160087357(A) |
申请公布日期 |
2016.07.21 |
申请号 |
KR20160004180 |
申请日期 |
2016.01.13 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
TAPILY KANDABARA N.;NAKAMURA GENJI |
分类号 |
H01L29/06;H01L21/02;H01L21/20;H01L21/3213;H01L29/41 |
主分类号 |
H01L29/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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