发明名称 METHOD FOR FORMING A NANOWIRE STRUCTURE
摘要 Disclosed is a method for forming a nanowire structure. The method for forming the nanowire structure comprises: a) step for forming a first semiconductor layer on a substrate; b) step for etching the first semiconductor layer to form a patterned first semiconductor layer; c) step for forming a dielectric layer on the patterned first semiconductor layer; and d) step for forming a second semiconductor layer on the patterned first semiconductor layer and the dielectric layer. The method for forming the nanowire structure comprises: e) step for repeating the a) step to the d) step at least once; f) step for repeating the a) step to the c) step after the e) step once; g) step for etching the patterned first semiconductor layer, the dielectric layer, and the second semiconductor layer to form a pin structure; and h) step for removing the patterned first semiconductor layer from the pin structure.
申请公布号 KR20160087357(A) 申请公布日期 2016.07.21
申请号 KR20160004180 申请日期 2016.01.13
申请人 TOKYO ELECTRON LIMITED 发明人 TAPILY KANDABARA N.;NAKAMURA GENJI
分类号 H01L29/06;H01L21/02;H01L21/20;H01L21/3213;H01L29/41 主分类号 H01L29/06
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