首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
EASILY TESTING CIRCUIT FOR PLA
摘要
申请公布号
KR960003366(B1)
申请公布日期
1996.03.09
申请号
KR19920007443
申请日期
1992.05.01
申请人
TOSHIBA K.K.
发明人
NOTSUYAMA, YASUYUKI
分类号
G01R31/28;G01R31/3185;G06F11/22;(IPC1-7):G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
您可能感兴趣的专利
CONNECTING METHOD
DEFLECTION YOKE
CIRCUIT-BREAKER
MANUFACTURE OF CONDUCTIVE COMPOSITE FILM
OPTICAL PICKUP FEEDER
CONDUCTIVE PROTRUSION TRANSFERRING BASE MATERIAL, CONDUCTIVE PROTRUSION TRANSFERRING METHOD AND MANUFACTURE OF PROBE CARD STRUCTURE
OPTICAL PICKUP DEVICE
SEMAPHORE FOR SAFE PASS AT INTERSECTION FOR EMERGENCY VEHICLE
IMAGE PRODUCING DEVICE
RETRIEVAL DEVICE
IMAGE PROCESSOR
METHOD AND SYSTEM FOR COMMUNICATION
DATA TRANSMISSION PROCESSING METHOD FOR BLACKBOARD MODEL
ROBOT CONTROL DEVICE
LIQUID CRYSTAL DRIVING CIRCUIT
IMAGE FORMING DEVICE
COLOR ELECTROPHOTOGRAPHY FOR HIGH-QUALITY INTERMEDIATE COLOR TONE PICTURE
FORMATION OF SUPER-HIGH CONTRAST PICTURE
CAMERA CAPABLE OF IMPRINTING DATA
MULTIPLEX WAVELENGTH AND MULTIPLEX DIODE LASER ROS