Method for the localization of time-critical events within a clock electronic circuit

摘要

Time-critical events are localized within a clocked electronic circuit without requiring cyclical operation By way of measuring at the outputs of the circuit, the limit frequency of the circuit is identified. A test pattern sequence is then applied to this circuit. The number n of that test pattern at which errors are perceived at the outputs is identified, in particular with a clock frequency higher than the identified limit frequency of the circuit. The test patterns having the numbers n-m are applied to the circuit with a clock frequency greater than the identified limit frequency of the circuit and the remaining n test patterns are applied to the circuit with a clock frequency lower than the identified limit frequency of the circuit, being applied thereto in succession step-by-step with m=1,2,3 . . . in at least one run of n test patterns. A check is carried out after every run of a test pattern sequence of n test patterns as to whether an error still exist at the output until an error can no longer be documented at the output and a determination is thus made with respect to which test pattern having the number n-m the error is generated within the -circuit. An error tracking technique is carried out in order to localize the cause of error within the electronic circuit.