发明名称 High-frequency ion source
摘要 PCT No. PCT/DE88/00152 Sec. 371 Date Nov. 20, 1989 Sec. 102(e) Date Nov. 20, 1989 PCT Filed Mar. 16, 1988 PCT Pub. No. WO88/07259 PCT Pub. Date Sep. 22, 1988.A high-frequency ion source for the production of an ion beam using electron cyclotron resonance has a tubular vessel whose shape matches the desired shape of the beam. The vessel, which is designed to accommodate an ionizable gas, is surrounded by a coil, and the coil is coupled to a high-frequency generator via a resonant circuit. A Helmholtz coil pair matched to the shape of the vessel is arranged to generate a magnetic field which is directed normal to the axis of the coil surrounding the vessel. The vessel is clamped between two plates and one of the plates contains a system for extracting ions from the vessel. The extraction system includes a plurality of spaced electrodes which function to attract and accelerate ions. The electrodes are formed with slotted openings which shape a stream of ions flowing out of the vessel into the form of a flat beam. An additional electrode can be provided to suppress the escape of electrons from the beam back into the vessel.
申请公布号 US5017835(A) 申请公布日期 1991.05.21
申请号 US19890415259 申请日期 1989.11.20
申请人 OECHSNER, HANS 发明人 OECHSNER, HANS
分类号 H01J27/16;H01J27/18;H01J37/08 主分类号 H01J27/16
代理机构 代理人
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