发明名称 |
Spectrometer with selectable radiation path from induction plasma light source |
摘要 |
<p>An atomic emission spectrometer includes an induction coupled plasma generator and a detector system for detecting the radiation relative to spectral wavelength. A first mirror is on the longitudinal axis of the generator to receive axial radiation therefrom. A second mirror is disposed laterally from the generator so as to reflect radial radiation therefrom parallel to the longitudinal axis toward a third mirror disposed laterally from the longitudinal axis. The third mirror passes the radiation to a fourth mirror positioned adjacent to the axial radiation without interfering therewith so as to reflect the radial radiation to the first mirror. The first mirror is rotated to a first orientation to reflect the axial radiation into the detector system, or to a second orientation to reflect the radial radiation into the detector system.</p> |
申请公布号 |
EP0708324(A2) |
申请公布日期 |
1996.04.24 |
申请号 |
EP19950115662 |
申请日期 |
1995.10.04 |
申请人 |
THE PERKIN-ELMER CORPORATION |
发明人 |
BARNARD, THOMAS W.;CROCKETT, MICHAEL I.;HUCKS, MICHAEL W. |
分类号 |
G01N21/73;G01N21/68;(IPC1-7):G01N21/68 |
主分类号 |
G01N21/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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