发明名称 Spectrometer with selectable radiation path from induction plasma light source
摘要 <p>An atomic emission spectrometer includes an induction coupled plasma generator and a detector system for detecting the radiation relative to spectral wavelength. A first mirror is on the longitudinal axis of the generator to receive axial radiation therefrom. A second mirror is disposed laterally from the generator so as to reflect radial radiation therefrom parallel to the longitudinal axis toward a third mirror disposed laterally from the longitudinal axis. The third mirror passes the radiation to a fourth mirror positioned adjacent to the axial radiation without interfering therewith so as to reflect the radial radiation to the first mirror. The first mirror is rotated to a first orientation to reflect the axial radiation into the detector system, or to a second orientation to reflect the radial radiation into the detector system.</p>
申请公布号 EP0708324(A2) 申请公布日期 1996.04.24
申请号 EP19950115662 申请日期 1995.10.04
申请人 THE PERKIN-ELMER CORPORATION 发明人 BARNARD, THOMAS W.;CROCKETT, MICHAEL I.;HUCKS, MICHAEL W.
分类号 G01N21/73;G01N21/68;(IPC1-7):G01N21/68 主分类号 G01N21/73
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