发明名称
摘要 <p>PURPOSE:To apply an adequate voltage to a scanning line, a data line and a common electrode, to observe the change of the transmissivity of liquid crystal, and to discriminate the various kinds of short circuit trouble from the result of the observation, so that the relief measure of the faulty picture element can be executed. CONSTITUTION:A power source 41 applies a VCOM (normally 0V) to the common electrode 26. The power source 40 applies a drain voltage VD (0 or 5V) to TFTs 24 and 25 through the data line 20. The power sources 42 and 43 apply gate voltages V1 and V2 respectively controlling the TFTs 24 and 25 through the pair of scanning lines 21 and 22. The V1 makes the TFT 24 turned off when it is -10V, and controls the transmissivity of the liquid crystal on a picture element electrode 23 from a white level to a black level according to the voltage value of the VD when it is 0-5V. The relation between the V2 and the TFT 25 is same as the relation between the V1 and the TFT 24. Thus, the various kinds of the short circuit faulty can be discriminated by the observation result of the change of the transmissivity of the liquid crystal with respect to the various combinations of the VD, V1 and V2.</p>
申请公布号 JP2957771(B2) 申请公布日期 1999.10.06
申请号 JP19910218976 申请日期 1991.08.29
申请人 FUJITSU KK 发明人 YOSHIOKA HIROSHI;OORA MICHA;MORITA KEIZO;TAKAHARA KAZUHIRO
分类号 G02F1/133;G01R31/02;G02F1/1343;G02F1/136;G02F1/1368;G09G3/36;(IPC1-7):G02F1/136 主分类号 G02F1/133
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